发明名称 SALT, RESIST COMPOSITION, AND METHOD OF PRODUCING RESIST PATTERN
摘要 <P>PROBLEM TO BE SOLVED: To solve the following problem: a resist composition containing the conventional acid generator does not necessarily satisfy demands for a focus margin (DOF) in a pattern obtained from the composition. <P>SOLUTION: There is provided a salt expressed by formula (I). In formula (I), R<SP POS="POST">1</SP>and R<SP POS="POST">2</SP>each independently represent a fluorine atom or a 1-6C perfluoroalkyl group; L<SP POS="POST">1</SP>represents a single bond or a divalent 1-17C saturated hydrocarbon group, in which a hydrogen atom included in the divalent saturated hydrocarbon group may be replaced with a fluorine atom, and a methylene group constituting the divalent saturated hydrocarbon group may be replaced with an oxygen atom or a carbonyl group; Y represents a 1-18C aliphatic hydrocarbon group or a 3-18C alicyclic hydrocarbon group which may have a substituent, in which a methylene group constituting the aliphatic hydrocarbon group or the alicyclic hydrocarbon group may be replaced with an oxygen atom, a sulfonyl group or a carbonyl group; and Z<SP POS="POST">1+</SP>represents an organic cation having a thiophene ring. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012067078(A) 申请公布日期 2012.04.05
申请号 JP20110169884 申请日期 2011.08.03
申请人 SUMITOMO CHEMICAL CO LTD 发明人 ICHIKAWA KOJI;ADACHI YUKAKO;MUKAI YUICHI
分类号 C07D333/34;C09K3/00;G03F7/004;G03F7/039;H01L21/027 主分类号 C07D333/34
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