发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SUBSTRATE PROCESSING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method and a substrate processing apparatus, which allow the creation of a cavity to be suppressed and enable an opening to be filled readily. <P>SOLUTION: A method comprises the steps of: forming an opening 206 in part of a dielectric film 204 of a wafer 12 having a metal film 202 made of Si and the dielectric film 204 formed on the metal film 202 to expose the metal film 202 in the opening 206; transporting the wafer 12 into a process chamber 106; selectively forming a first Si film 252 on the metal film 202 of the wafer 12 while supplying at least DCS and Cl<SB POS="POST">2</SB>into the process chamber 106; and forming a second Si film 254 on the dielectric film 204 and first Si film 252 of the wafer 12 while supplying at least DCS into the process chamber 106. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012069636(A) 申请公布日期 2012.04.05
申请号 JP20100211879 申请日期 2010.09.22
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 IZUMI MANABU;MORIYA ATSUSHI;ISHIBASHI KIYOHISA
分类号 H01L21/205;C01B33/027;C23C16/24 主分类号 H01L21/205
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