发明名称 GLASS SUBSTRATE DEFECT INSPECTION DEVICE AND GLASS SUBSTRATE DEFECT INSPECTION METHOD
摘要 PURPOSE: A glass substrate defect inspecting device and an inspection method thereof are provided to reduce or remove bouncing phenomenon and steadily perform an inspection by reducing the corrected amount during the inspection. CONSTITUTION: A glass substrate(100) comprises a lifting device, a transfer device, and an optical inspection device. The lifting device lifts up a glass substrate(P) using air. The transfer device transfers the glass substrate to an inspection area where the lifting device is absent. The optical inspection device takes a picture of the glass substrate, thereby performing an inspection. A glass substrate defect inspecting device comprises a reduction device. The reduction device reduces the displacement caused by the bouncing of an end part of the glass substrate toward a transferring direction.
申请公布号 KR20120031872(A) 申请公布日期 2012.04.04
申请号 KR20110083274 申请日期 2011.08.22
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 ARAKI MASAKI;HIROI SYUICHI;KINUGAWA KOHEI
分类号 G01N21/88;G01B11/30;H01L21/66 主分类号 G01N21/88
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