发明名称 RADIATION-SENSITIVE RESIN COMPOSITION
摘要 A pattern forming method includes (1) selectively exposing a first resist layer, and developing the exposed first resist layer to form a first pattern, (2) applying a resin composition containing a hydroxyl group-containing resin and a solvent to the first pattern, baking the applied resin composition, and developing the baked resin composition to form a second pattern, the hydroxyl group-containing resin becoming insoluble or scarcely soluble in a developer when baked, and (3) totally or selectively exposing the second pattern to make the second pattern partly soluble in the developer, and developing the exposed second pattern to form a third pattern in which at least a hole or a groove is formed in the second pattern.
申请公布号 KR20120032024(A) 申请公布日期 2012.04.04
申请号 KR20127003205 申请日期 2008.05.21
申请人 JSR CORPORATION 发明人 NAKAMURA ATSUSHI;SHIMOKAWA TSUTOMU;TAKAHASHI JUNICHI;ABE TAKAYOSHI;NAGAI TOMOKI;KAKIZAWA TOMOHIRO
分类号 G03F7/039;G03F7/004 主分类号 G03F7/039
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