发明名称 ROBUST MEMORY LINK TESTING USING MEMORY CONTROLLER
摘要 REUT (Robust Electrical Unified Testing) for memory links is introduced which speeds testing, tool development, and debug. In addition it provides training hooks that have enough performance to be used by BIOS to train parameters and conditions that have not been possible with past implementations. Address pattern generation circuitry is also disclosed.
申请公布号 KR20120031960(A) 申请公布日期 2012.04.04
申请号 KR20117031641 申请日期 2010.12.10
申请人 INTEL CORP. 发明人 SPRY BRYAN L.;SCHOENBORN THEODORE Z.;ABRAHAM PHILIP;MOZAK CHRISTOPHER P.;ELLIS DAVID G.;NEJEDLO JAY J.;QUERBACH BRUCE;GREENFIELD ZVIKA;GHATTAS RONY;THOLIYIL JAYASEKHAR;LUCAS CHARLES D.;YUNKER CHRISTOPHER E.
分类号 G11C29/10 主分类号 G11C29/10
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