发明名称 Method for manufacturing semiconductor device for preventing occurrence of short circuit between bit line contact plug and storage node contact plug
摘要 A method for manufacturing a semiconductor device includes the steps of forming a plug on a semiconductor substrate, forming an insulation layer over the semiconductor substrate having the plug formed thereon, defining a line type trench through a first etching of a partial thickness of the insulation layer; and defining a contact hole through a second etching of a portion of the insulation layer corresponding to the bottom of the trench so as to expose the plug.
申请公布号 US8148250(B2) 申请公布日期 2012.04.03
申请号 US20100914318 申请日期 2010.10.28
申请人 KIM HYOUNG JOON;KWON HO YUP;PARK JEONG HOON;KIM SUNG HYUN;HYNIX SEMICONDUCTOR INC. 发明人 KIM HYOUNG JOON;KWON HO YUP;PARK JEONG HOON;KIM SUNG HYUN
分类号 H01L21/44 主分类号 H01L21/44
代理机构 代理人
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