| 摘要 |
The invention provides a method and a measurement system for characterization of luminescence properties, the method comprises irradiating the luminescent material with a pulse of excitation light, providing a triggering signal correlated to the pulse of excitation light; detecting with a photodetector such as a photomultiplier tube (PMT) a plurality of photons emitted from the luminescent material as result of the pulse of excitation light, the photodetector providing an output signal upon the event of detection of a photon; determining for each detected photon a photon arrival time and providing an output suitable for inputting to an analysing module wherein an output comprises zero, one, or more photon arrival time for each excitation, receiving said outputs in an analysing module; and determining in the analysing module, characteristics properties of the luminescent material by performing a statistical analysis based on Bayesian inference. |
