发明名称 Method of polishing silicon wafer
摘要 A silicon wafer is polished by applying a polishing solution substantially containing no abrasive grain onto a surface of a polishing pad having a given fixed grain bonded abrasive and then relatively sliding the polishing pad to a silicon wafer to polish the surface of the silicon wafer, wherein a hydroplane layer is formed by the polishing solution supplied between the surface of the silicon wafer and the surface of the polishing pad and a thickness of the hydroplane layer is controlled to change a polishing state of the surface of the silicon wafer.
申请公布号 US8147295(B2) 申请公布日期 2012.04.03
申请号 US20090472480 申请日期 2009.05.27
申请人 KATOH TAKEO;TANIMOTO RYUICHI;OGATA SHINICHI;TAKUSHIMA TAKERU;TAKAISHI KAZUSHIGE;SUMCO CORPORATION 发明人 KATOH TAKEO;TANIMOTO RYUICHI;OGATA SHINICHI;TAKUSHIMA TAKERU;TAKAISHI KAZUSHIGE
分类号 B24B1/00;B24B37/10;B24B37/12;H01L21/304 主分类号 B24B1/00
代理机构 代理人
主权项
地址