发明名称 Optical Scattering Type Paticle Measurement Apparatus
摘要 PURPOSE: An optical scattering type particle measurement apparatus is provided to accurately measure the distribution of particles by increasing the amount of scattered light collected to a light detection unit. CONSTITUTION: An optical scattering type particle measurement apparatus comprises a light generation unit(200), a light detection unit(300), and a reflective mirror(400). The light generation unit generates incident light(I) in order to form a focus in a measurement chamber. The light detection unit collects and detects the incident light and scattered light(R1) passing through the focus area of the incident light. In the reflective mirror, amount of the light-received scattered light increases in the optical detecting part. The reflective mirror reflects the scattered light to the light detection unit to increase the amount of the scattered light collected to the light detection unit.
申请公布号 KR101132406(B1) 申请公布日期 2012.04.03
申请号 KR20090093196 申请日期 2009.09.30
申请人 发明人
分类号 G01N21/53;G01N15/02;G01N21/94 主分类号 G01N21/53
代理机构 代理人
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