发明名称 Test data processing apparatus and test data processing method
摘要 The test data processing apparatus of the present invention is a test data processing apparatus for processing test data obtained by testing defects of a sheet-shaped product having at least an optical film which is a member of an optical displaying apparatus, comprising a defect information preparing section, wherein, on the basis of surface defect test data relating to a surface defect and bright point test data relating to a bright point obtained when the optical film or a laminate body containing the optical film is regarded as an object of testing, in a case that a position of the surface defect and a position of the bright point are identical, the surface defect and the bright point located at the identical position are not regarded as a defect for processing by the defect information preparing section.
申请公布号 US8149376(B2) 申请公布日期 2012.04.03
申请号 US20070870110 申请日期 2007.10.10
申请人 OHASHI HIROMICHI;NITTO DENKO CORPORATION 发明人 OHASHI HIROMICHI
分类号 G02F1/13 主分类号 G02F1/13
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