发明名称 |
DEFECT DIMENSION MEASURING APPARATUS, DEFECT DIMENSION MEASUREMENT METHOD, AND PROGRAM |
摘要 |
<P>PROBLEM TO BE SOLVED: To exactly measure dimensions of a defect of a test object with level difference to the optical axis direction of an imaging apparatus. <P>SOLUTION: A plane coordinate acquisition part 302 acquires plane coordinates of pixels showing the defect of the test object included in image data. A space coordinate conversion part 305 converts the plane coordinates acquired by the plane coordinate acquisition part 302 into space coordinates showing an intersection point between the surface of a three-dimensional model showing appearance of the test object arranged in a virtual space and a straight line on the virtual space corresponding to a point shown by the plane coordinates. A virtual dimension calculation part 307 calculates the dimensions of the defect in the virtual space using a plurality of space coordinates converted by the space coordinate conversion part 305. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012063310(A) |
申请公布日期 |
2012.03.29 |
申请号 |
JP20100209422 |
申请日期 |
2010.09.17 |
申请人 |
MITSUBISHI HEAVY IND LTD |
发明人 |
NAKAO KENTA;KENMOCHI KEIICHI;MAEHARA TAKESHI;NAKAYAMA HIROYUKI |
分类号 |
G01B11/02;G01B11/03;G01B11/30 |
主分类号 |
G01B11/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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