发明名称 DEFECT DIMENSION MEASURING APPARATUS, DEFECT DIMENSION MEASUREMENT METHOD, AND PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To exactly measure dimensions of a defect of a test object with level difference to the optical axis direction of an imaging apparatus. <P>SOLUTION: A plane coordinate acquisition part 302 acquires plane coordinates of pixels showing the defect of the test object included in image data. A space coordinate conversion part 305 converts the plane coordinates acquired by the plane coordinate acquisition part 302 into space coordinates showing an intersection point between the surface of a three-dimensional model showing appearance of the test object arranged in a virtual space and a straight line on the virtual space corresponding to a point shown by the plane coordinates. A virtual dimension calculation part 307 calculates the dimensions of the defect in the virtual space using a plurality of space coordinates converted by the space coordinate conversion part 305. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012063310(A) 申请公布日期 2012.03.29
申请号 JP20100209422 申请日期 2010.09.17
申请人 MITSUBISHI HEAVY IND LTD 发明人 NAKAO KENTA;KENMOCHI KEIICHI;MAEHARA TAKESHI;NAKAYAMA HIROYUKI
分类号 G01B11/02;G01B11/03;G01B11/30 主分类号 G01B11/02
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