发明名称 CHARGED PARTICLE BEAM IRRADIATION DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a charged particle beam irradiation device which can improve the efficiency of beam utilization by reducing an unused amount of beams. <P>SOLUTION: An irradiation field forming unit 500 includes a scanning electromagnet which scans a charged particle beam emitted from a synchrotron 200 in a direction perpendicular to the beam advance direction. An irradiation order determination system 63 of a control unit 600 predicts a circling beam amount which will be lost when a circling beam being accelerated for some energy is reaccelerated or decelerated for another energy, and, by using a circling beam charge amount measured by a circling beam charge amount monitor 25 and an irradiation dose measured by an irradiation dose monitor 52, changes the operation pattern of the synchrotron so as to minimize the lost circling beam amount through entire irradiation, thereby determining the order of energy to be irradiated with. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012064403(A) 申请公布日期 2012.03.29
申请号 JP20100206932 申请日期 2010.09.15
申请人 HITACHI LTD 发明人 YAMADA TAKAHIRO;EBINA FUTARO;NODA FUMIAKI
分类号 H05H13/04;A61N5/10;G21K5/04 主分类号 H05H13/04
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