发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 As for a bypass capacitor, a first capacitor insulating film, together with a tunnel insulating film of a storage element, is formed of a first insulating film, a first electrode being a lower electrode, together with floating gate electrodes of the storage element, is formed of a doped·amorphous silicon film (a crystallized one), a second capacitor insulating film, together with a gate insulating film of transistors of 5 V in a peripheral circuit, is formed of a second insulating film, and a second electrode being an upper electrode, together with control gate electrodes of the storage element and gate electrodes of the transistors in the peripheral circuit, is formed of a polycrystalline silicon film.
申请公布号 US2012074478(A1) 申请公布日期 2012.03.29
申请号 US201113170711 申请日期 2011.06.28
申请人 SUGIMACHI TATSUYA;FUJITSU SEMICONDUCTOR LIMITED 发明人 SUGIMACHI TATSUYA
分类号 H01L27/06;H01L21/8239 主分类号 H01L27/06
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