发明名称 ABRASIVE-FREE POLISHING SYSTEM
摘要 <p>The invention provides a chemical-mechanical polishing system comprising a water-soluble silicate compound, an oxidizing agent that oxidizes at least a part of a substrate,water, and a polishing pad, wherein the polishing system is substantially free of abrasiveparticles. The invention further provides a method of chemically-mechanically polishinga substrate with the aforementioned polishing system. The polishing system isparticularly useful in the removal of tantalum.No Figure</p>
申请公布号 SG178632(A1) 申请公布日期 2012.03.29
申请号 SG20100059459 申请日期 2006.08.09
申请人 CABOT MICROELECTRONICS CORPORATION 发明人 CHERIAN, ISAAC;MOEGGENBORG, KEVIN
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