发明名称 PATTERN FORMATION METHOD AND DEVICE MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To suppress nonuniformity of a pattern formed on a substrate while maintaining an exposure amount within a predetermined range. <P>SOLUTION: A pattern formation method forms a pattern on a photosensitive substrate by irradiating the substrate with exposure light from a projection optical system through a mask pattern with a line part and a space part. The pattern formation method comprises the steps of: determining whether or not an integrated exposure amount in a projection area of the projection optical system necessary for forming the pattern on the substrate is within a predetermined range; changing the mask pattern to another mask pattern having the same pitch of the line part and the space part as the mask pattern, and the different line width ratio of the line part and the space part from the mask pattern when the integrated exposure amount is not within the predetermined range; deciding an exposing condition and a development condition by using the another mask pattern; exposing the substrate with the exposure light irradiating the projection area on the exposing condition; and developing the substrate on the development condition. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012064666(A) 申请公布日期 2012.03.29
申请号 JP20100205864 申请日期 2010.09.14
申请人 NIKON CORP 发明人 YOKOTA MUNEYASU
分类号 H01L21/027 主分类号 H01L21/027
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