| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an abnormality inspection system which can inspect an abnormality in a cooling unit of an electronic circuit, such as a packaging defect or a functional fault, by using a sure yet simple technique. <P>SOLUTION: An abnormality inspection system for a cooling unit 3 in an electronic circuit 1, comprising a heat generating component 2 and a cooling unit 3 for cooling the heat generating component 2, includes a component temperature detection unit 4 which detects the temperature of the heat generating component 2, and an abnormality determination unit 7 which determines whether the cooling unit has any abnormality based on a first component temperature detected by the component temperature detection unit 4 before a circuit operation raising the temperature of the heat generating component 2 is executed and a second component temperature detected by the component temperature detection unit after the circuit operation is executed. Letting the first component temperature be T1 and the second component temperature be T2, if a relational expression T2>f(T1) in a function f:T2=f(T1) indicating a predetermined boundary between normality and abnormality in the cooling unit is satisfied, then the abnormality determination unit determines that an abnormality exists. <P>COPYRIGHT: (C)2012,JPO&INPIT |
