发明名称 ABNORMALITY NOTIFICATION SYSTEM AND SEMICONDUCTOR TESTING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To quickly and surely perform abnormality processing when abnormality detection circuits detect abnormality. <P>SOLUTION: An abnormality notification system 1, in which a plurality of submodules 4 are connected with a main module controlling the submodules 4 via a bus 2, includes: serial transmission routes 5 for outputting an interrupt signal from the submodules 4 to the main module 3; parallel/serial conversion sections 24 each provided in the submodule 4, converting a plurality of bits of output information in which module specification information for specifying a submodule 4 is attached to abnormality information indicating that a plurality of abnormality detecting circuits 20 detect abnormality, from parallel data into serial data and outputting it to the serial transmission route 5; and a serial/parallel conversion section 12 provided in the main module 3, converting the output information that is input from the serial transmission route 5, from the serial data into the parallel data and acquiring the abnormality information and the module specification information. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012063837(A) 申请公布日期 2012.03.29
申请号 JP20100205560 申请日期 2010.09.14
申请人 YOKOGAWA ELECTRIC CORP 发明人 YUKITA SATOSHI
分类号 G06F11/30;G01R31/28 主分类号 G06F11/30
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