发明名称 Structures for semiconductor structures with error detection and correction
摘要 A design structure including design data describing a semiconductor structure. The semiconductor structure includes a first semiconductor chip and a second semiconductor chip. The first semiconductor chip is on top of and bonded to the second semiconductor chip. The first and second semiconductor chips include a first and a second electric nodes. The second semiconductor chip further includes a first comparing circuit. The semiconductor structure further includes a first coupling via electrically connecting the first electric node of the first semiconductor chip to the first comparing circuit of the second semiconductor chip. The first comparing circuit is capable of (i) receiving an input signal from the second electric node directly, (ii) receiving an input signal from the first electric node indirectly through the first coupling via, and (iii) asserting a first mismatch signal in response to the input signals from the first and second electric nodes being different.
申请公布号 US8146046(B2) 申请公布日期 2012.03.27
申请号 US20080120701 申请日期 2008.05.15
申请人 DALTON TIMOTHY JOSEPH;FAUCHER MARC RAYMOND;KARTSCHOKE PAUL DAVID;SANDON PETER ANTHONY;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 DALTON TIMOTHY JOSEPH;FAUCHER MARC RAYMOND;KARTSCHOKE PAUL DAVID;SANDON PETER ANTHONY
分类号 G06F17/50 主分类号 G06F17/50
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