发明名称 Method of manufacturing semiconductor device having plural transistors formed in well region and semiconductor device
摘要 A first transistor and a second transistor are formed in a first element formation region, and a third transistor is formed in a second element formation region. The three transistors are of the same conductive type, and the first transistor and the second transistor have the same threshold voltage. A first well is formed in the first element formation region by use of a first mask pattern, and a second well is formed in the second element formation region by use of a second mask pattern. A channel region of the first transistor and a channel region of the second transistor have a shape which is line-symmetrical with respect to a reference line. The first mask pattern has a shape which is line-symmetrical with respect to the reference line.
申请公布号 US8143119(B2) 申请公布日期 2012.03.27
申请号 US20090585379 申请日期 2009.09.14
申请人 SAKOH TAKASHI;SHIRAI HIROKI;RENESAS ELECTRONICS CORPORATION 发明人 SAKOH TAKASHI;SHIRAI HIROKI
分类号 H01L21/336 主分类号 H01L21/336
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