发明名称 |
Method of manufacturing semiconductor device having plural transistors formed in well region and semiconductor device |
摘要 |
A first transistor and a second transistor are formed in a first element formation region, and a third transistor is formed in a second element formation region. The three transistors are of the same conductive type, and the first transistor and the second transistor have the same threshold voltage. A first well is formed in the first element formation region by use of a first mask pattern, and a second well is formed in the second element formation region by use of a second mask pattern. A channel region of the first transistor and a channel region of the second transistor have a shape which is line-symmetrical with respect to a reference line. The first mask pattern has a shape which is line-symmetrical with respect to the reference line. |
申请公布号 |
US8143119(B2) |
申请公布日期 |
2012.03.27 |
申请号 |
US20090585379 |
申请日期 |
2009.09.14 |
申请人 |
SAKOH TAKASHI;SHIRAI HIROKI;RENESAS ELECTRONICS CORPORATION |
发明人 |
SAKOH TAKASHI;SHIRAI HIROKI |
分类号 |
H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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