发明名称 Method for fabricating semiconductor memory device
摘要 <p>PURPOSE: A manufacturing method of a semiconductor memory device is provided to improve more a degree of integration of the semiconductor memory device by forming an information storage device on the upper/lower or the sidewall of a switching element. CONSTITUTION: A first information storage device is formed on a first semiconductor substrate(100). A switching device is formed on the first information storage devices. A second information storage device is formed on the switching devices. A first electrode(132) connected with the switching device is formed. A second electrode(134) is formed on the first electrode. A logic device electrically connected with the switching device is formed on the lower part of the first information storage device.</p>
申请公布号 KR101120676(B1) 申请公布日期 2012.03.23
申请号 KR20090004355 申请日期 2009.01.19
申请人 发明人
分类号 H01L21/82;H01L21/8242;H01L21/8247 主分类号 H01L21/82
代理机构 代理人
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