发明名称 QFN PROCESS FOR STRIP TEST
摘要 A process for assembling semiconductor devices comprises encapsulating a leadframe matrix having semiconductor die mounted thereon in a mold compound. The leadframe matrix is partially singulated to electrically isolate each individual leadframe unit. A plurality of leadframe units is tested simultaneously. The leadframe matrix is completely singulated. Non compliant units are discarded.
申请公布号 US2012066899(A1) 申请公布日期 2012.03.22
申请号 US201113304590 申请日期 2011.11.25
申请人 UTAC THAI LIMITED 发明人 SIRINORAKUL SARAVUTH;NONDHASITTHICHAI SOMCHAI
分类号 B23P21/00 主分类号 B23P21/00
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