发明名称 |
MULTIPLE CONTACT PROBES |
摘要 |
<p>The present invention is a probe array for probing a device using a power probe pin with one or more projections or skates to enhance scrub performance and having a width greater than the input signal probe pin to avoid high current damage to the probe. An additional invention is the provision of a fan ie Peltier at the side of the probe array test device for cooling the probe array.</p> |
申请公布号 |
WO2012036922(A1) |
申请公布日期 |
2012.03.22 |
申请号 |
WO2011US50368 |
申请日期 |
2011.09.02 |
申请人 |
MICROPROBE, INC.;KISTER, JANUARY |
发明人 |
KISTER, JANUARY |
分类号 |
G01R1/073;G01R31/28;H01L23/24 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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