发明名称 M+N PROGRAMMING AND M+L BIT READ FOR M BIT MEMORY CELLS
摘要 A memory device and programming and/or reading process is described that programs and/or reads the cells in the memory array with higher threshold voltage resolution than required. In programming non-volatile memory cells, this allows a more accurate threshold voltage placement during programming and enables pre-compensation for program disturb, increasing the accuracy of any subsequent read or verify operation on the cell. In reading/sensing memory cells, the increased threshold voltage resolution allows more accurate interpretations of the programmed state of the memory cell and also enables more effective use of probabilistic data encoding techniques such as convolutional code, partial response maximum likelihood (PRML), low-density parity check (LDPC), Turbo, and Trellis modulation encoding and/or decoding, reducing the overall error rate of the memory.
申请公布号 KR101125876(B1) 申请公布日期 2012.03.22
申请号 KR20107013374 申请日期 2008.11.18
申请人 发明人
分类号 G11C16/34;G11C16/12;G11C16/30 主分类号 G11C16/34
代理机构 代理人
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