| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a gage for three-dimensional coordinate measuring instrument that is constituted more easily with higher precision, and a precision evaluation method using the gage for three-dimensional coordinate measuring instrument. <P>SOLUTION: The gage 1 for three-dimensional coordinate measuring instrument for evaluating precision of a three-dimensional measuring instrument is constituted by including a first sphere 4 and a second sphere 5 fixed on a surface of a substrate 3, and a third sphere 6 fixed on a first column 7 provided protruding from the surface of the substrate 3. <P>COPYRIGHT: (C)2012,JPO&INPIT |
