发明名称 |
CHARGE SENSING AMPLIFIER CIRCUIT FOR COMPENSATING FOR DC LEAKAGE CURRENT, AND X-RAY READOUT INTEGRATED CIRCUIT AND X-RAY SENSOR USING SAME |
摘要 |
A charge sensing circuit according to the present invention includes a photodiode, an operational amplifier, a feedback capacitor, a leakage path transistor for allowing DC leakage current to flow from the photodiode, and a current generating unit for providing drive current. Since a drain and a source are connected between the photodiode and a negative input terminal of the operational amplifier and a power source, and also connected to allow a gate voltage to be determined by the voltage at both ends of a current source transistor where some of the drive current flows and a compensation capacitor, the leakage path transistor may effectively leak a DC leakage current occurring at the photodiode. The current generating unit may stably generate drive current against voltage and temperature variation because it includes a source degeneration resistance. |
申请公布号 |
WO2012036496(A2) |
申请公布日期 |
2012.03.22 |
申请号 |
WO2011KR06836 |
申请日期 |
2011.09.16 |
申请人 |
LUXEN TECHNOLOGIES, INC.;SOH, MYUNG JIN;AN, TAI JI |
发明人 |
SOH, MYUNG JIN;AN, TAI JI |
分类号 |
H03F3/70;H03F3/45;H05G1/26 |
主分类号 |
H03F3/70 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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