发明名称 Method of Manufacturing a Semiconductor Device
摘要 A semiconductor device includes a substrate having a first area and a second area, a first active structure disposed in the first area, a second active structure disposed in the second area, a first transistor disposed in the first area and a second transistor disposed in the second area. The second active structure may have a height substantially the same as a height of the first active structure. The first transistor includes a first gate structure enclosing an upper portion of the first active structure, a first impurity region formed at a lower portion of the first active structure, and a second impurity region formed at the upper portion of the first active structure. The second transistor includes a second gate structure formed on the second active structure and third impurity regions formed at an upper portion of the second active structure.
申请公布号 US2012070950(A1) 申请公布日期 2012.03.22
申请号 US201113306421 申请日期 2011.11.29
申请人 YOON JAE-MAN;OH YONG-CHUL;KIM HUI-JUNG;CHUNG HYUN-WOO;KIM KANG-UK 发明人 YOON JAE-MAN;OH YONG-CHUL;KIM HUI-JUNG;CHUNG HYUN-WOO;KIM KANG-UK
分类号 H01L21/8242 主分类号 H01L21/8242
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