发明名称 CHARACTERISTIC EVALUATION METHOD AND CHARACTERISTIC EVALUATION SYSTEM FOR PHOTORECEPTOR AND EXPOSURE OPTICAL SYSTEM DESIGNING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a new method for evaluating a photoconductive photoreceptor characteristic on which an electrostatic latent image is formed by an optical writing means through dot exposure. <P>SOLUTION: A beam profile on a beam exposure surface for dot exposure is specified as a beam profile function f. The profile of an electrostatic latent image formed on the photoreceptor by dot exposure by a beam that gives the beam profile function f is specified as an electrostatic latent image profile function g. A deterioration function h is obtained from de-convolution calculation using the specified beam profile function f and electrostatic latent image profile function g. Based on this deterioration function h, the photoreceptor characteristic is evaluated. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012058289(A) 申请公布日期 2012.03.22
申请号 JP20100198356 申请日期 2010.09.03
申请人 RICOH CO LTD 发明人 AISAKA KEISHIN
分类号 G03G21/00 主分类号 G03G21/00
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