摘要 |
<P>PROBLEM TO BE SOLVED: To provide a new method for evaluating a photoconductive photoreceptor characteristic on which an electrostatic latent image is formed by an optical writing means through dot exposure. <P>SOLUTION: A beam profile on a beam exposure surface for dot exposure is specified as a beam profile function f. The profile of an electrostatic latent image formed on the photoreceptor by dot exposure by a beam that gives the beam profile function f is specified as an electrostatic latent image profile function g. A deterioration function h is obtained from de-convolution calculation using the specified beam profile function f and electrostatic latent image profile function g. Based on this deterioration function h, the photoreceptor characteristic is evaluated. <P>COPYRIGHT: (C)2012,JPO&INPIT |