发明名称 METHOD AND APPARATUS FOR EVALUATING LIGHT-EMITTING ELEMENT
摘要 <P>PROBLEM TO BE SOLVED: To evaluate a wavelength variation of output wavelengths of a light-emitting element by a simple method. <P>SOLUTION: An evaluation method includes: a first step for measuring optical outputs of first light outputted from a semiconductor laser 5 by a photodiode 9 in a state that the semiconductor laser 5 is arranged in a thermostatic chamber and an etalon filter 11 is arranged between the semiconductor laser 5 and the photodiode 9 and in a state that the etalon filter 11 is retreated; a second step for measuring optical outputs of second light outputted from the semiconductor laser 5 by the photodiode 9 in a state that the etalon filter 11 is arranged between the semiconductor laser 5 and the photodiode 9 after lapse of predetermined time while supplying a current to the semiconductor laser 5 and in a state that the etalon filter 11 is retreated; and a step for deriving a difference between the output wavelength of the first light and the output wavelength of the second light based on the transmissivity of the first light through the etalon filter 11 and the transmissivity of the second light through the etalon filter 11. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012057944(A) 申请公布日期 2012.03.22
申请号 JP20100198196 申请日期 2010.09.03
申请人 SUMITOMO ELECTRIC IND LTD 发明人 YAMAZAKI YASUO
分类号 G01M11/00;H01S5/00 主分类号 G01M11/00
代理机构 代理人
主权项
地址