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发明名称
METHOD AND APPARATUS FOR TESTING A SYSTEM-ON-CHIP INVOLVING PARALLEL AND SERIAL ACCESSES
摘要
申请公布号
KR101121306(B1)
申请公布日期
2012.03.22
申请号
KR20107012435
申请日期
2008.11.24
申请人
发明人
分类号
G06F11/26
主分类号
G06F11/26
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代理人
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