发明名称 EEPROM CELL WITH CHARGE LOSS
摘要 An EEPROM memory cell that includes a dual-gate MOS transistor in which the two gates are separated by an insulation layer, wherein the insulation layer includes a first portion and a second portion having lower insulation properties than the first one, the second portion being located at least partially above a channel area of the transistor.
申请公布号 US2012068689(A1) 申请公布日期 2012.03.22
申请号 US20080812533 申请日期 2008.12.31
申请人 FORNARA PASCAL;STMICROELECTRONICS (ROUSSET) SAS 发明人 FORNARA PASCAL
分类号 G01R19/00;H01L21/316;H01L21/318;H01L29/788 主分类号 G01R19/00
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