| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a test control apparatus for a delay element, which is capable of further reducing the number of minimum units of delay element groups to be compared and can improve an inspection precision of a tester for delay elements. <P>SOLUTION: A test control apparatus is provided in a delay circuit 13 in which a plurality of delay elements are connected in series, and the delay elements connected in series are divided into a uniform number beforehand. Output signals from each of delay element groups after the division into the uniform number are selectively switched by a selector 20 and outputted, and it is determined by a determination circuit 17 whether a differential amount between selected signals exceeds a predetermined time or not. <P>COPYRIGHT: (C)2012,JPO&INPIT |
