发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 A control circuit during an erase operation sets a voltage of a first line connected to a selected cell unit to a voltage larger than a voltage of a gate of a first transistor included in the selected cell unit by an amount of a first voltage, sets a voltage difference between a voltage of a first line connected to an unselected cell unit and a voltage of a gate of a first transistor included in the unselected cell unit to a second voltage which differs from the first voltage, applies in the selected cell unit and the unselected cell unit a third voltage to a gate of at least one of dummy memory transistors in a dummy memory string, and applies a fourth voltage to a gate of another one of the dummy memory transistors in the dummy memory string, the fourth voltage being lower than the third voltage.
申请公布号 US2012069661(A1) 申请公布日期 2012.03.22
申请号 US201113233407 申请日期 2011.09.15
申请人 IWAI HITOSHI;KABUSHIKI KAISHA TOSHIBA 发明人 IWAI HITOSHI
分类号 G11C16/28;G11C16/04 主分类号 G11C16/28
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