发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR |
摘要 |
<p>A semiconductor device provided with a first field-effect transistor formed on a first active region (103a) of a semiconductor substrate (100). Said first field-effect transistor has: a first gate-insulating film (106a) formed on top of the first active region (103a); and a first gate electrode (115a) formed on top of the first gate-insulating film (106a). The first gate electrode (115a) comprises: a first metal electrode (107a) formed on top of the first gate-insulating film (106a); a first interface layer (110a) formed on top of the first metal electrode (107a); and a first silicon electrode (111a) formed on top of the first interface layer (110a).</p> |
申请公布号 |
WO2012035679(A1) |
申请公布日期 |
2012.03.22 |
申请号 |
WO2011JP02064 |
申请日期 |
2011.04.07 |
申请人 |
PANASONIC CORPORATION;TAKEOKA, SHINJI |
发明人 |
TAKEOKA, SHINJI |
分类号 |
H01L29/78;H01L21/336;H01L21/8238;H01L27/092;H01L29/423;H01L29/49 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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