发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 <p>A semiconductor device provided with a first field-effect transistor formed on a first active region (103a) of a semiconductor substrate (100). Said first field-effect transistor has: a first gate-insulating film (106a) formed on top of the first active region (103a); and a first gate electrode (115a) formed on top of the first gate-insulating film (106a). The first gate electrode (115a) comprises: a first metal electrode (107a) formed on top of the first gate-insulating film (106a); a first interface layer (110a) formed on top of the first metal electrode (107a); and a first silicon electrode (111a) formed on top of the first interface layer (110a).</p>
申请公布号 WO2012035679(A1) 申请公布日期 2012.03.22
申请号 WO2011JP02064 申请日期 2011.04.07
申请人 PANASONIC CORPORATION;TAKEOKA, SHINJI 发明人 TAKEOKA, SHINJI
分类号 H01L29/78;H01L21/336;H01L21/8238;H01L27/092;H01L29/423;H01L29/49 主分类号 H01L29/78
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