| 发明名称 |
METHOD FOR RESISTANCE VALUE COMPENSATION, CIRCUIT HAVING RESISTANCE VALUE COMPENSATION FUNCTION, TEST METHOD OF RESISTANCE VALUE OF CIRCUIT, RESISTANCE VALUE COMPENSATION PROGRAM, TEST PROGRAM OF RESISTANCE VALUE OF CIRCUIT, AND SYSTEM |
| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a resistance compensating system using an ODT circuit which is simple and high in accuracy. <P>SOLUTION: An ODT circuit 200 can realize a resistance value equivalent to a designated resistance value by combining a plurality of transistors, and is configured to sequentially change a resistance value realized by selected transistors by selecting transistors to be combined. <P>COPYRIGHT: (C)2012,JPO&INPIT |
| 申请公布号 |
JP2012060140(A) |
申请公布日期 |
2012.03.22 |
| 申请号 |
JP20110225175 |
申请日期 |
2011.10.12 |
| 申请人 |
FUJITSU LTD |
发明人 |
MIYAKE HIROFUMI;TOKUHIRO NOBUYUKI;AIKAWA TADAO;MIYAZAKI YUJI |
| 分类号 |
H01L21/822;G06F12/00;H01L21/82;H01L27/04;H03H11/28 |
主分类号 |
H01L21/822 |
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