发明名称 TESTING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a testing device capable of highly accurately and easily specifying a failure portion of an apparatus to be tested in a short time. <P>SOLUTION: The testing device performing a test based on a plurality of test items on the apparatus to be tested having a plurality of modules comprises: a determination criterion storage section storing determination criterion information for determining a faulty module based on the combination of the acceptability of test result of each of the test items; a faulty module information storage section storing information of an actually faulty module for each combination of the acceptability of the test result; a test execution section performing a test on the apparatus to be tested; a test result determination section determining the acceptability of the test result; a faulty module identification section identifying a faulty module candidate based on the determination criterion information and the determination result of the test results; and a determination criterion update section updating the determination criterion information based on the faulty module information stored in the faulty module information storage section. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012058120(A) 申请公布日期 2012.03.22
申请号 JP20100202818 申请日期 2010.09.10
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 IWASHITA KATSUNORI
分类号 G01D21/00 主分类号 G01D21/00
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