| 摘要 |
<P>PROBLEM TO BE SOLVED: To increase the use rate of an input/output pin of a measurement device and to increase the number of measured devices to be simultaneously subjected to measurement testing. <P>SOLUTION: A plurality of input/output pins included in a measurement device are associated with a plurality of semiconductor devices by a predetermined number greater than a preset number. The measurement device is caused to recognize that, among the predetermined number of input/output pins associated with the plurality of semiconductor devices, the preset number of input/output pins are input/output pins allocated to the semiconductor devices, and the remaining input/output pins are allocated to at least one virtual device. In a seeming state to the measurement device where measurement testing of the plurality of semiconductor devices and the virtual device is executed by using the preset number of input/output pins, measurement testing of the plurality of semiconductor devices is carried out simultaneously by using the predetermined number of input/output pins associated with the semiconductor devices. <P>COPYRIGHT: (C)2012,JPO&INPIT |
