发明名称 SYSTEMS AND METHODS FOR AUTOMATED, RAPID DETECTION OF HIGH-ATOMIC-NUMBER MATERIALS
摘要 The present invention is directed to an inspection system that has a radiation source, a detector array, an inspection region, and a processing unit, where the processing unit a) obtains a radiographic image, b) segments the radiographic image based on radiation attenuation or transmission, c) identifies at least one segmented area on the radiographic image, d) filters the at least one segmented area using at least one geometric filter, e) generates feature vectors using the filtered segmented area; and f) compares the feature vectors against predefined values to determine whether a high-atomic-number object is present.
申请公布号 EP2430396(A2) 申请公布日期 2012.03.21
申请号 EP20100851521 申请日期 2010.05.16
申请人 RAPISCAN SECURITY PRODUCTS, INC. 发明人 ARMISTEAD, ROBERT, A. JR.;BROWNE, JOLYON, A.;CHANG, WILLIAM, Z.;FRANCO, EDWARD, D.;BENDAHAN, JOSEPH
分类号 G01B15/02 主分类号 G01B15/02
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