Method for measuring thickness of the organic thin layer and Apparatus for measuring the organic thin layer,申请号KR20090097588-传众专利搜索

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发明名称	Method for measuring thickness of the organic thin layer and Apparatus for measuring the organic thin layer
摘要
申请公布号	KR101127863(B1)	申请公布日期	2012.03.21
申请号	KR20090097588	申请日期	2009.10.14
申请人		发明人
分类号	G01B15/02;G01N23/20;G01T1/16	主分类号	G01B15/02
代理机构		代理人
主权项
地址

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