发明名称 APPARATUS FOR TESTING CIRCUIT PACKAGES
摘要 Apparatus for testing circuit packages including a test sequence generator which is connected to a contactor for making contact to the leads of a circuit package. The contactor includes an inclined track for slidably receiving integrated circuit packages, and circuit package storage tubes connected to the ends of the inclined track. The contactor has a test region at which a circuit package is held by a rocker member. Contact means having a plurality of fingers is operated to make contact with the leads of an integrated circuit package in the test region. A test sequence may then be conducted. After the test sequence the rocker member is operated to release the integrated circuit package which has just been tested from the test region. Another circuit package then moves into the test region and the testing sequence is initiated again.
申请公布号 US3701021(A) 申请公布日期 1972.10.24
申请号 USD3701021 申请日期 1970.11.27
申请人 SIGNETICS CORP. 发明人 GEORGE L. ISAAC;RICHARD F. KINGSBURY;JOHN G. SURAK
分类号 G01R31/28;(IPC1-7):G01R31/22;B07C5/34 主分类号 G01R31/28
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