<p>A processing system for a capacitive sensor device comprises circuitry and logic; and the capacitive sensor device comprises a first plurality of sensor electrodes and a second plurality of sensor electrodes. The processing system is configured to acquire a first plurality of capacitive measurements by emitting and receiving first electrical signals with the first plurality of sensor electrodes of the capacitive sensor device. The processing system is also configured to select a first set of the first plurality of sensor electrodes based on the first plurality of capacitive measurements. The processing system is further configured to acquire a second plurality of capacitive measurements by emitting second electrical signals with the first set of the first plurality of sensor electrodes and receiving the second electrical signals with the second plurality of sensor electrodes.</p>