| 发明名称 |
Visual inspection method and apparatus and image analysis system |
| 摘要 |
An image feature is calculated based on the image of a detected defect, a coordinate feature is calculated based on position coordinates of the detected defect, and false alarm judgment is performed according to a decision tree constructed by threshold processing to the image feature or the coordinate feature. |
| 申请公布号 |
US8139841(B2) |
申请公布日期 |
2012.03.20 |
| 申请号 |
US20080141947 |
申请日期 |
2008.06.19 |
| 申请人 |
SHIBUYA HISAE;MAEDA SHUNJI;HITACHI HIGH-TECHNOLOGIES CORPORATION |
发明人 |
SHIBUYA HISAE;MAEDA SHUNJI |
| 分类号 |
G06K9/00 |
主分类号 |
G06K9/00 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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