| 摘要 |
An OPC automation apparatus and manufacturing method of a semiconductor device using the same, being capable of improving the fabrication yield of a semiconductor device by establishing a system and an OPC automation apparatus in which an engineer computer and a work station are connected to one database such that all OPC tasks are monitored in the engineer computer and the OPC task is automatically performed. An OPC automation apparatus may include a first computer that receives a first OPC information from outside to store; and a second computer that receives the first OPC information from the first computer to perform an OPC process, generates a second OPC information from the result of the performance of an OPC process, and delivers the second OPC information to the first computer, wherein the second computer delivers the second OPC information to the first computer such that the first computer is able to compare and analyze the first OPC information with the second OPC information. |
