| 摘要 |
PURPOSE: A method for testing a semiconductor device is provided to effectively screen a bridge fault between a landing plug contact and a passing gate. CONSTITUTION: A first word line(WL1) and a second word line(WL2) are activated at the same time. Stress voltage is applied in the first word line and the second word line. Data saved in a first cell and a second cell is reversed. A third word line and a fourth word line which is contiguous to the first word line and the second word line are activated. Data fail of the second cell and the first cell is detected by leading data of the first cell after activating the third word line and by leading data of the second cell after activating the fourth word line.
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