发明名称 METHODS TO ADJUST THRESHOLD VOLTAGE IN SEMICONDUCTOR DEVICES
摘要 Methods for forming a device on a substrate are provided herein. In some embodiments, a method of forming a device on a substrate may include providing a substrate having a partially fabricated first device disposed on the substrate, the first device including a first film stack comprising a first dielectric layer and a first high-k dielectric layer disposed atop the first dielectric layer; depositing a first metal layer atop the first film stack; and modifying a first upper surface of the first metal layer to adjust a first threshold voltage of the first device, wherein the modification of the first upper surface does not extend through to a first lower surface of the first metal layer.
申请公布号 WO2012033574(A2) 申请公布日期 2012.03.15
申请号 WO2011US45320 申请日期 2011.07.26
申请人 APPLIED MATERIALS, INC.;WARD, MICHAEL G.;PEIDOUS, IGOR V.;CHIANG, SUNNY;TA, YEN B.;DARLAK, ANDREW;PORSHNEV, PETER I.;SRINIVASAN, SWAMINATHAN 发明人 WARD, MICHAEL G.;PEIDOUS, IGOR V.;CHIANG, SUNNY;DARLAK, ANDREW;PORSHNEV, PETER I.;SRINIVASAN, SWAMINATHAN
分类号 H01L21/336;H01L21/8228;H01L29/78 主分类号 H01L21/336
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