METHOD AND SYSTEM FOR DETERMINING THE QUALITY OF A STORAGE SYSTEM

摘要

In accordance with an exemplary embodiment of the present invention, a method (100) for measuring a quality parameter of an optical storage system comprising a non-diffraction-limited optical storage medium and a readout device, the method comprising the process of deriving (110) an impulse response of the optical storage system, and the process of analyzing (120) the impulse response to determine at least one of a width of the impulse response and a skewness of the impulse response as the quality parameter.