发明名称 |
METHOD AND DEVICE FOR MEASURING THE RELIABILITY OF AN INTEGRATED CIRCUIT |
摘要 |
Electromigration may cause a fault to appear in an integrated circuit located on a semiconductor chip. To detect such a fault, at least one resistive test structure is provided separated from the integrated circuit and located on at least one metallization level of the integrated circuit. During operation of the integrated circuit, the resistive test structure is sensed. Detection of a voltage difference between two points of the resistive test structure is indicative of a fault.
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申请公布号 |
US2012062268(A1) |
申请公布日期 |
2012.03.15 |
申请号 |
US201113230981 |
申请日期 |
2011.09.13 |
申请人 |
CHEVALLIER REMY;HUARD VINCENT;KAPOOR NEERAJ;FEDERSPIEL XAVIER;STMICROELECTRONICS PVT LTD.;STMICROELECTRONICS (CROLLES 2) SAS |
发明人 |
CHEVALLIER REMY;HUARD VINCENT;KAPOOR NEERAJ;FEDERSPIEL XAVIER |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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