发明名称 |
MEASUREMENT DEVICE AND MEASUREMENT METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a technique to enhance fluorescent light in a technique to measuring fluorescent light of a thin film. <P>SOLUTION: A measurement device measures the fluorescent light of a thin film 12, and includes a transparent member supporting section for supporting a prism 10 in which a thin film sample 13 including the thin film 12 is laminated in an environment comprising an arbitrary medium or vacuum; excitation means for increasing light absorption in the thin film sample 13 by radiating light L1 from the prism 10 side with a specific incident angle of a critical angle at an interface between the prism 10 and the environment or more; and fluorescent light measuring means for measuring fluorescent light L3 from the thin film 12 which is enhanced by increasing the light absorption. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012053001(A) |
申请公布日期 |
2012.03.15 |
申请号 |
JP20100197638 |
申请日期 |
2010.09.03 |
申请人 |
SEISHIN SHOJI KK;INSTITUTE OF NATIONAL COLLEGES OF TECHNOLOGY JAPAN |
发明人 |
WAKAMATSU TAKASHI;MARUYAMA TOMOAKI;KITAMI TADAAKI;TOYOSHIMA SUSUMU |
分类号 |
G01N21/64;G01N21/21;G01N21/47 |
主分类号 |
G01N21/64 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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