发明名称 MEASUREMENT DEVICE AND MEASUREMENT METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a technique to enhance fluorescent light in a technique to measuring fluorescent light of a thin film. <P>SOLUTION: A measurement device measures the fluorescent light of a thin film 12, and includes a transparent member supporting section for supporting a prism 10 in which a thin film sample 13 including the thin film 12 is laminated in an environment comprising an arbitrary medium or vacuum; excitation means for increasing light absorption in the thin film sample 13 by radiating light L1 from the prism 10 side with a specific incident angle of a critical angle at an interface between the prism 10 and the environment or more; and fluorescent light measuring means for measuring fluorescent light L3 from the thin film 12 which is enhanced by increasing the light absorption. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012053001(A) 申请公布日期 2012.03.15
申请号 JP20100197638 申请日期 2010.09.03
申请人 SEISHIN SHOJI KK;INSTITUTE OF NATIONAL COLLEGES OF TECHNOLOGY JAPAN 发明人 WAKAMATSU TAKASHI;MARUYAMA TOMOAKI;KITAMI TADAAKI;TOYOSHIMA SUSUMU
分类号 G01N21/64;G01N21/21;G01N21/47 主分类号 G01N21/64
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