发明名称 POWER SUPPLY UNIT FOR TEST DEVICE AND TEST DEVICE USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a power supply unit which can flexibly emulate performance of a set power source. <P>SOLUTION: A voltage source 10 generates power supply voltage V<SB POS="POST">OUT</SB>stabilized so as to coincide with a voltage level according to reference voltage V<SB POS="POST">REF</SB>and supplies the power supply voltage to a DUT 1. A current detection circuit 20 generates detection voltage Vm according to output current I<SB POS="POST">OUT</SB>flowing to the DUT 1. The reference voltage V<SB POS="POST">REF</SB>generated by a reference voltage generation circuit 30 is made an initial voltage level according to input voltage V<SB POS="POST">IN</SB>in an initial state, and transits to a first voltage level V<SB POS="POST">L1</SB>which is shifted from the initial voltage level by a first voltage width according to the detection voltage Vm when the output current I<SB POS="POST">OUT</SB>flows. Subsequently, the reference voltage V<SB POS="POST">REF</SB>transits to a second voltage level V<SB POS="POST">L2</SB>which is shifted from the initial voltage level by a second voltage width according to the detection voltage Vm. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012052862(A) 申请公布日期 2012.03.15
申请号 JP20100194348 申请日期 2010.08.31
申请人 ADVANTEST CORP 发明人 KODERA SATOSHI;SHIMIZU TAKAHIKO
分类号 G01R31/28 主分类号 G01R31/28
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