发明名称 Nonvolatile Memory Device and Method of Manufacturing the Same
摘要 A method of manufacturing a nonvolatile memory device wherein first gate lines and second gate lines are formed over a semiconductor substrate. The first gate lines are spaced-from each other at a first width, the second gate lines are spaced-from each other at a second width, and the first width is wider than the second width. A first ion implantation process of forming first junction regions in the semiconductor substrate between the first gate lines and the second gate lines is performed. A second ion implantation process of forming second junction regions in the respective first junction regions between the first gate lines is then performed.
申请公布号 US2012061770(A1) 申请公布日期 2012.03.15
申请号 US201113298096 申请日期 2011.11.16
申请人 LEE HEE YOUL;NOH JAE YOON;HYNIX SEMICONDUCTOR INC. 发明人 LEE HEE YOUL;NOH JAE YOON
分类号 H01L27/088;H01L21/8234 主分类号 H01L27/088
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