发明名称 CHIP ON FILM (COF) PACKAGE HAVING TEST LINE FOR TESTING ELECTRICAL FUNCTION OF CHIP AND METHOD FOR MANUFACTURING SAME
摘要 A chip on film (COF) package and a method for manufacturing same are provided. The COF package comprises a base film, a semiconductor chip mounted on the base film, a signal-inputting portion mounted on the base film, a first passive element mounted on the base film and comprising first and second terminals and a first signal line formed on the base film and connecting the first passive element to the semiconductor chip, wherein the first signal line comprises a connection pad connected to the first terminal of the first passive element and a first test line connected to the signal-inputting portion.
申请公布号 US2012061669(A1) 申请公布日期 2012.03.15
申请号 US201113212527 申请日期 2011.08.18
申请人 KIM HYOUNG-HO;JUNG YE-JUNG;SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM HYOUNG-HO;JUNG YE-JUNG
分类号 H01L23/58;H01L21/66 主分类号 H01L23/58
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